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Application Notes

Comparing the ADS1201 to the CS5321 [745k]

Texas Instruments
The intent of this application bulletin is to provide a simple means of comparing the operation of the ADS1201 delta-sigma modulator to Crystal's CS5321 delta-sigma modulator. It is not the intent of

AN025 -- CC1020 RF MODEM

Texas Instruments
AN025 -- CC1020 RF MODEM

Appendix E: Understanding Integrated Circuit Package Power Capabilities (Rev. A)

Texas Instruments
Appendix E: Understanding Integrated Circuit Package Power Capabilities

TMS320DM648/7 SoC Architecture and Throughput Overview

Texas Instruments
This application report provides information on the DM648/7 throughput performance and describes the DM648/7 System-on-Chip (SoC) architecture data path infrastructure and constraints that affect the throughput and different optimization techniques for optimum system performance. This document also provides information on the maximum possible throughput performance of different peripherals on th

Active Clamp Transformer Reset: High Side or Low Side?

Texas Instruments
UCC2891 Active Clamp Transformer Reset: High Side or Low Side?

Using the TPS56xx To Power DSPs (Rev. A)

Texas Instruments
The synchronous buck converter controllers (TPS56100, TPS56300, TPS56xx, and TPS5602) made by Texas Instruments are specifically designed to provide excellent transient response and high efficienty to

TMS320VC5510 Power Consumption Summary

Texas Instruments
This document assists in the estimation of power consumption for the TMS320C5510 digital signal processor (DSP). As power consumption can vary widely on this device a spreadsheet was developed to provide a better estimate. This allows the user to tailor the prediction to their particular application. It also allows designers the ability to test the efficiency of different configurations before an

DC Parameters: Input Offset Voltage

Texas Instruments
The input offset voltage, VIO, is a common dc parameter in operational amplifier (op amp) specifications. This report aims to familiarize the engineer by discussing the basics and modern aspects of VI

Interfacing the ADS7822 to the TMS3420C5402 DSP

Texas Instruments
This report presents a method for interfacing the ADS7822 12-bit SAR analog-to-digital converter to the TMS320C5402 DSP.

An MSP430F11x1 Sigma-Delta Type Millivolt Meter

Texas Instruments
This application report describes a method of implementing a low-cost, 12-bit sigma-delta type A/D converter using the MSP430F11x1 family of 16-bit RISC-like mixed signal processors. The solution

Solid State Voice Recorder Using Flash MSP430

Texas Instruments
The promise of cost-effective re-programmable MSP430 MCU systems has recently come to fruition with the integration of In-System Programmable (ISP) flash memory. Firmware delivered just in time during

A Multichannel/Algorithm Implementation on the TMS320C6000 DSP (Rev. B)

Texas Instruments
This application report describes how to build digital signal processing (DSP) algorithm modules for multichannel applications running on the TMS320C6000 DSP. In addition the basic requirements for multichannel/algorithm implementations that is reentrant and relocatable are presented along with practical approaches for multichannel implementation. This document includes example programs to ill

Remove the DC Portion of Signals with the ADS7817

Texas Instruments
Unwanted portions of a signal such as a DC pedestal can be difficult to reject in a single supply circuit. A DC pedestal voltage most typically appears at the output of an operational amplifier with a small signal riding on top of it. This pedestal voltage is required in the analog domain to insure that the small signal that contains the pertinent information never falls below the ground potenti

Hardware-Based Extension To The JTAG Architecture

Texas Instruments
This document provides a brief overview of the IEEE 1149.1 standard and SCOPE octal ICs. It discusses the SCOPE architecture that provides the extended testing capabilities for these ICs. SCOPE octal applications are discussed with examples showing the improved testing and diagnostic capabilities of the ICs in a production environment. This document is reprinted with permission from the IEEE.

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