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Application Notes

Calculator for CAN Bit Timing Parameters

Texas Instruments
Controller Area Network (CAN) nodes use user-specified timing parameters to sample the asynchronous bitstream and recover the clock. These parameters are typically based on the frequency of the available reference oscillator. There may be several options available for a given frequency and some of them will allow a looser oscillator tolerance than others. This application report details the creat

LDOs Thermal Performance in Small SMD Packages

Texas Instruments
The application report LDOs Thermal Performance in Small SMD Packages covers common questions regarding linear regulators and thermal metrics. Thisdocument also provides low dropout linear regulators (LDO) thermal performance comparison betweencontinuous load conditions and pulsed load conditions.

Enable Functionality and Adjusting Under Voltage Lockout for TPS57112-Q1 Device

Texas Instruments
Enable Functionality and Adjusting Under Voltage Lockout for TPS57112-Q1 Device /HVAL/MSA/Power/2-App_Reports

Clocking High Speed Serial Links with LMK033X8 (Rev. A)

Texas Instruments
This application report outlines the advantages of using ultra-high performance clock generators from Texas Instruments to generate system clocks needed for high-speed serial links. A methodology for deriving reference clock jitter requirements for high-speed Ethernet link is described and the advantages of clocking such a system with the LMK03328 as opposed to discrete crystal oscillators are ou

Host System Calibration Method (Rev. B)

Texas Instruments
To add improvements to the Impedance Track™ algorithm changes have been made to free up firmwarecode space. In the process of freeing up code space the calibration calculations are no longerautomatically performed by the gauge but must be performed by the host and the results written back tothe gauge. This application note provides a flow on how to implement the calibration algorithm on a

AN-2029 Handling & Process Recommendations (Rev. E)

Texas Instruments

This application report provides recommendations for handling, storing, and mounting Texas Instruments' surface mount IC packages.

The final manufacturing yield and board level reliability are influenced by various factors and processes outside the control of the IC manufacturer. This application note is intended only as a guideline or reference. Due to the variety of possible board assembly materials and equipments, Texas Instruments advises the user to consult their individual suppliers and vendors.

Reverse Current Protection in Load Switches

Texas Instruments
Reverse current occurs when current travels from output to input (rather than from input to output) asFigure 1 shows. This application note outlines where reverse current comes from why it can be harmful toa system and how to modify a design to provide protection from reverse current in a system.

Battery-Less NFC/RFID Temperature Sensing Patch (Rev. A)

Texas Instruments
NFC/RFID enables communication with transponders. The transponders include memory that can store various information including URLs Bluetooth® connection handover contact information diagnostics and now sensor measurement data. Battery-less sensor measurements that utilize energy harvesting from the RF field can be implemented in applications ranging from medical health and fitness and indus

High Voltage Half Bridge Design Guide for LMG3410 Smart GaN FET (Rev. A)

Texas Instruments

As gallium nitride (GaN) power FETs become readily available for power designers to use, their promise of performance improvement with higher efficiencies and greater power densities can begin to become realized. By having better material properties over silicon, loss elements such as on-state resistance Rds(on) and output capacitance Coss are smaller for an equal die area. These GaN power FET devices, included in the LMG3410x family, are typically offered in high electron mobility transistor (HEMT) structures, which along with maximizing the material property benefits eliminate the reverse recovery Qrr when the device operates in third quadrant mode (conduction from source to drain). These benefits allow GaN power FETs to operate faster and at higher frequencies than previously capable. With typical slew rates around 30 V/ns to 100 V/ns at operating voltages around 380 V to 480 V, printed circuit board (PCB) layout optimization is even more essential since parasitic inductances and capacitances from poor layouts can drastically reduce performance or even prevent operation. When pushed to their limits to maximize system gains power GaN FETs provide the device can degrade and potentially overheat without a carefully designed thermal system to dissipate the generated heat. To prevent these problems from hampering designs and limiting performance layout recommendations, peripheral component selection and thermal system design are discussed.

A Guide to Debugging With CCS on the DRA7xx, TDA2xx and TDA3xx Family of Devices

Texas Instruments
A Guide to Debugging With CCS on the DRA7xx, TDA2xx and TDA3xx Family of Devices

Using LMZ31710 for Higher Output Voltages

Texas Instruments
The LMZ31710 power module has been designed and characterized for operation at output voltages from0.6 V to 5.5 V. However several applications require higher voltages than the standard point-of-loadvoltages that the LMZ31710 is designed for. Following the guidance in this application note theLMZ31710 can be used for output voltages up to 9.5 V. All data included in this application note h

Migrating from the MSP430F5xx,F6xx Family to the MSP430FR58xx/FR59xx/68xx Family (Rev. C)

Texas Instruments

This application report helps enable easy migration from MSP430F5xx and MSP430F6xx flash-based MCUs to the MSP430FR58xx/FR59xx/68xx/69xx FRAM-based MCUs.

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