An Accurate Thermal-Evaluation Method for the TLV62065

Texas Instruments

Published Date: 06/04/2014

Description

The increase of power density has resulted in the need for accurate measurement of die junctiontemperature. This application report is a basic overview of thermal evaluation and provides an accurateevaluation method of junction temperature in a real application. The evaluation method described in thisapplication is confirmed with bench measurements. This method is proven to be easy to use an

Parts

Part Number Name Companion Part