This application report is intended to illustrate the capability of cascading multiple Texas Instruments (TI) linking addressable scan port (LASP) devices. It explains configuring the secondary test access ports (TAPs) of cascaded LASPs with the help of a single linking shadow protocol and protocol-bypass inputs. Several examples of linking shadow protocol along with timing requirements and scan
Part Number | Name | Companion Part | |
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SN74LVT8986PM | SN74LVT8986PM | Buy Datasheet |