Clock jitter analyzed in the time domain, Part 2

Texas Instruments

Published Date: 11/15/2010

Description

Part 1 of this three-part article series focused on how to accurately estimate jitter from a clock source and combine it with the aperture jitter of an ADC. In this article, Part 2, that combined jitter will be used to calculate the ADC’s signal-to-noise ratio (SNR), which will then be compared against actual measurements.

Parts

Part Number Name Companion Part
CDCE72010RGCR CDCE72010RGCR Buy Datasheet
CDCE72010RGCRG4 CDCE72010RGCRG4 Buy Datasheet