IEEE 1149.1 Use In Design For Verification And Testability

Texas Instruments

Published Date: 10/01/1996

Description

Some new products aimed at standardizing and reducing the cost of integrated circuit (IC) system test and debug are compatible with IEEE 1149.1. This document introduces those products that include ASIC cells standard interface ICs a bus master IC a controller interface board for IBM compatibles a high-speed scan interface and software to control the scan bus. A detailed evaluation of trade-