Input Impedance Measurement Using ADC FFT Data

Texas Instruments

Published Date: 01/11/2011

Description

Texas Instruments has introduced a family of high-speed analog-to-digital converters (ADCs) suited tomeet the demand for high-speed and high-IF sampling systems. To achieve the highest overall system performance an analog front-end circuit with an antialiasing filter must drive the ADC with the highestpossible dynamic range and lowest distortions. One important parameter of the front-end circ

Parts

Part Number Name Companion Part