Partitioning Designs With IEEE 1149.1 Scan Capabilities

Texas Instruments

Published Date: 08/01/1996

Description

This document provides an overview of the scan-path linker (SPL) and the scan-path selector (SPS) used to implement IEEE 1149.1 boundary-scan test. It discusses the use of remote bus controller interfaces and partitioning IEEE 1149.1 designs that use the scan-path support devices. The SN74ACT8999 is used in a SPS design and the SN74ACT8997 is used in a SPL design.