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Single Event Upset and Latchup Consider for CMOS Devices Operated at 3.3 V (Rev. A)

Texas Instruments

Published Date: 08/17/2009

Description

AN-989 Single Event Upset and Latchup Considerations for CMOS Devices Operated at 3.3 V

Application Note

Download application note for Single Event Upset and Latchup Consider for CMOS Devices Operated at 3.3 V (Rev. A) by Texas Instruments