Standard Procedure Direct Measurement Sub-picosecond RMS Jitter High-Speed ADC

Standard Procedure Direct Measurement Sub-picosecond RMS Jitter High-Speed ADC

Texas Instruments

Published Date: 06/30/2004

Description

A Standardized Procedure for the Direct Measurement of Sub-picosecond RMS Jitter in High-Speed Analog-to-Digital Converters

Parts

Part Number	Name	Companion Part

Application Note

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