TIDA-00070 Reference Design

Texas Instruments

FPGA Firmware Project for Measuring Bit Errors in the Output Word of an A to D Converter

Description

For applications where there are bit errors and resulting sample errors (also called sparkle codes: word errors: or code errors): the ability to measure the Error rates caused by these bit errors is important. This FPGA firmware based application note proposes a method to accurately measure these errors over an indefinite time and provides an example of how this measurement can be done using a simple FPGA platform. Code is available on request for the two examples described in the application note.

Features
  • Understand how Error Rates are specified and what these specifications meanOutline new approach to measuring the sample errors over an indefinite time period to measure the true error rate of an ADCProvide customers the ability to make bit error measurements on their bench under different conditionsFirmware is available for low cost FPGA platfrom TI along with simple GUI to monitor the error rates over time
Applications
  • Oscilloscopes & digitizers
Product Categories
  • Data converters

End Equipment Reference Diagrams

Parts

Part Number Name Companion Part
ADS4249 ADS4249 Buy Datasheet
ADS5402 ADS5402 Buy Datasheet

Bill Of Materials

Download the bill of materials for TIDA-00070 Download

Schematic

Quickly understand overall system functionality.

Download the schematic for TIDA-00070

Test Data

Get results faster with test and simulation data that's been verified.

Download the test file for TIDA-00070

Other Documents

Title Updated Type Size (KB)
TIDA-00070 Gerber 13 Dec 2013 ZIP 953
TIDA-00070 BOM 13 Dec 2013 PDF 119
TIDA-00070 Schematic 13 Dec 2013 PDF 82
TIDA-00070 PCB 13 Dec 2013 PDF 530