TIDA-00076 Reference Design

Texas Instruments

Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements

Description

This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI: patterns are loaded into the TSW3085EVM which is comprised of the DAC3482: TRF3705: and LMK04806.

Features
  • Hardware reference design and Demonstration platform for a complete digital to RF transmitterA Process and setup to test performance metrics for modulated signals such as Error vector Magnitude (%EVM) and Adjacent Channel Power Ratio (ACPR) are providedResults are tabulated for external clocking of the DAC and also for using the internal PLL of the DACAn easy to use evaluation platform to make standards compliant measurements
Applications
  • Outdoor backhaul unit
  • Vector signal transceiver (VST)
  • Indoor backhaul
  • Wireless communications test
Product Categories
  • Data converters

Parts

Part Number Name Companion Part
CDCV304 CDCV304 Buy Datasheet
DAC3482 DAC3482 Buy Datasheet
LMK04806 LMK04806 Buy Datasheet
LP2985-50 LP2985-50 Buy Datasheet
TPS2400 TPS2400 Buy Datasheet
TPS62290 TPS62290 Buy Datasheet
TPS62420 TPS62420 Buy Datasheet
TPS7A8001 TPS7A8001 Buy Datasheet
TRF3705 TRF3705 Buy Datasheet

Bill Of Materials

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Schematic

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Design File

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Test Data

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Other Documents

Title Updated Type Size (KB)
TIDA-00076 Layer Plots 16 May 2014 ZIP 2276
TIDA-00076 BOM 16 May 2014 PDF 72
TIDA-00076 Schematic 16 May 2014 PDF 446