Description

This reference design showcases space- and cost-optimized architecture for a 4-channel DC-input binary module with improved measurement accuracy and status indication using only two products simplifying system design. MCU-based binary module improves measurement resolution of binary input resulting in improved system performance for accurate and repeatable fault indications and eliminates the need for multiple hardware versions (use same design for multiple nominal voltage inputs). This reduces design: testing: manufacturing and field support efforts. In this design: 4-input channels are configured as group isolated inputs to minimize cost per channel. A 10-bit analog-to-digital converter (ADC) measures the DC inputs within ±3% ±1-V accuracy over wide range. Pre-compliance tests for EMI and EMC have been performed.